STMicroelectronics has introduced the VNF1248F automotive e-fuse MOSFET controller, the newest device in its STi2Fuse family.

The gate current is programmable, helping engineers minimize MOSFET switching noise to meet electromagnetic compatibility ...

Mouser Electronics, the authorised global distributor of semiconductors and electronic components, has partnered with ...

Lewis Hamilton’s first official test with Ferrari in the SF-23 Formula 1 car at Fiorano circuit. Captured with trackside footage of warm-up laps, high-speed runs, and the distinctive Ferrari F1 engine ...

Congratulations to the LEAP Awards for Test & Measurement winners, who are profiled here: Liquid Instruments’ Moku:Delta is ...

Today’s test engineers face unprecedented demands as semiconductor designs grow more complex and product cycles accelerate.

Advantest Corporation announced the MTe power test platform. The MTe redefines test efficiency and scalability.

Abstract: Digital static random access memory-based in-memory computing (SRAM-IMC) is a promising computation paradigm to break the von-Neumann bottleneck. However, the IMC architectures also bring a ...

Abstract: Hybrid fault diagnosis in analog circuits remains a challenging task, particularly due to the overlapping characteristics of different component faults, which often degrade the ...

Relive the highlights of the MotoGP™ race for the Grand Prix of the Netherlands 2025.

This repository contains comprehensive documentation and analysis for Week 4 of the VSD RISC-V SOC Tapeout Program. The focus is on understanding fundamental circuit design principles, MOSFET device ...