Voltage and power integrity are becoming increasingly critical and challenging for chip designers and architects, regardless of which process technology they are using or which market they are ...
Abstract: This paper develops a degradation test scheme for insulated gate bipolar transistors (IGBTs) that are subjected to repeated electrostatic discharge (ESD). The proposed 7-step scheme is ...
Abstract: This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during ...
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