High-precision analysis of 2D materials microstructures achieved using electron microscopy and machine learning

A research team led by NIMS has, for the first time, produced nanoscale images of two key features in an ultra-thin material: ...

Ultrafast electron diffraction captures atomic layers twisting in response to light

A pulse of light sets the tempo in the material. Atoms in a crystalline sheet just a few atoms thick begin to move—not ...
Scientific Research Publishing

Parish, C., Batchelor, D., Progl, C. and Russell, P. (2007) Tutorial: Electron Beam-Induced Current in the Scanning Electron Microscope. Microscopy and Analysis, 21, 11-13.

ABSTRACT: In active semiconductor devices, the junction characteristics are critical for the electrical performance. As an alternative of the atomic force microscopy (AFM)-based electrical techniques ...
C&EN

Tuning the Two-Dimensional Electron Gas at Oxide Interfaces with Ti–O Configurations: Evidence from X-ray Photoelectron Spectroscopy

† Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, Peoples’ Republic of China § School of Physical Sciences, University ...