Abstract: Because of the isolation of transistors, fully depleted silicon-on-insulator (FDSOI) technology nodes have shown better single-event upset (SEU) resilience compared with bulk technology ...
Abstract: In the presence of signal interference and glitches, Double-Edge Triggered Flip-Flops (DETFFs) experience a substantial rise in power consumption. To address this issue and achieve power ...
PRO TIP: Add your old phone for a handy size reference.
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