Unpicking How to Measure the Complexity of Knots

Two mathematicians have proved that a straightforward question—how hard is it to untie a knot?—has a complicated answer.
IEEE

Equivalent Circuit Model for Simulating ESD Discharge Current in ESD Damage Test

Abstract: Electrostatic discharge (ESD) damage evaluation methods for common mode choke (CMC) and ESD suppression devices are standardized in IEC 62228-5 Annex E and Annex F, respectively. The ...
IEEE

Generating Simple Cyclic Memristive Neural Network Circuit With Controllable Multiscroll Attractors and Multivariable Amplitude Control

Abstract: Due to their synaptic-like characteristics and memory properties, memristors are often used in neuromorphic circuits, particularly neural network circuits. However, most of the existing ...