In this interview, Sue Berets, the Applications Scientist at Harrick Scientific, talks to AZoM about specular reflectance measurements and the difference between absolute and relative. Please tell us ...

Manufacturers are adopting automated optical inspection (AOI) systems based on phase shift profilometry (PSP) for applications in advanced packaging processes. Many of these processes use front ...

The surface dynamics of amorphous and semicrystalline polymer films have been measured using helium atom scattering. Time-of-flight data were collected to resolve the elastic and inelastic scattering ...

DRIFTS is routinely used in quality control applications, materials characterization, and catalytic studies in industrial and research settings. However, optimal instrument setup and sample ...

Film Scatter is a powerful system for solving complex optical modeling problems. Film Scatter is composed of standalone Applications withutilities that can be used to create new problem solving ...